Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference (한국전기전자재료학회:학술대회논문집)

The Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회)
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A Study on the Stacked type Film Chip Capacitor

적층형 필름 Chip Capacitor 개발

  • 송호근 (삼화전기(주) 기술연구소) ;
  • 박상식 (삼화전기(주) 기술연구소) ;
  • 연강흠 (삼화전기(주) 기술연구소) ;
  • 김성호 (삼화전기(주) 기술연구소)
  • Published : 1991.10.01

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Abstract

In this study of stacked type film chip capacitor, the important parameters are heat-treated temperature, pressure and time. We measured the temperature dependence of dielectric properties and dissipation factor and the frequency dependence of dielectric properties, dissipation factor, ESR(Equivalent Series Resistance) and impedance in stacked type film capacitor. As a result, the best conditions of heat-treated temperature, pressure and time were proved to be 130$^{\circ}C$, 10kg/$\textrm{cm}^2$ and 3hrs, respectively.

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