Development of VLSI Process Simulator

반도체 공정 시뮬레이터 개발에 관한 연구

  • 이경일 (인하대학교 공과대학 전자재료공학과) ;
  • 공성원 (인하대학교 공과대학 전자재료공학과) ;
  • 윤상호 (인하대학교 공과대학 전자재료공학과) ;
  • 이제희 (인하대학교 공과대학 전자재료공학과) ;
  • 원태영 (인하대학교 공과대학 전자재료공학과)
  • Published : 1994.11.01

Abstract

The TCAD(Technology Computer Aided Design) software tool is a popular name to be able to simulate the semiconductor process and device circuit. We have developed a two-dimensional TCAD software tool included an editor, parser, each process unit, and 2D, 3D graphic routine that is Integrated Environment. The initial grid for numerical analysis is automatically generated with the geometric series that use the user default(given) line and position separated with grid interval and the nodes corresponding to each mesh point stoic the all the possible attribute. Also, we made a data structure called PIF for input or output. Methods of ion implantation in this paper arc Monte Carlo, Gaussian Pearson and Dual-Pearson. Analytical model such as Gaussian, Pearson and Dual-Pearson were considered the multilayer structure and two-dimensional tilted implantation. We simuttaneously calculated the continuity equation of impurity and point defect in diffusion simulation. Oxidation process was simulated by analytical ERFC(Complementary Error Function) model for local oxidation.

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