Proceedings of the KIEE Conference (대한전기학회:학술대회논문집)
- 1995.07b
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- Pages.623-627
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- 1995
Analysis and optimization of Wiel-Dobke synthetic testing circuit parameters
Weil-Dobke 합성단락 시험회로의 Parameter 분석과 최적화
- Kim, Maeng-Hyun (High power and high Voltage div. KERI) ;
- Rhyou, Hyeong-Kee (High power and high Voltage div. KERI) ;
- Park, Jong-Wha (High power and high Voltage div. KERI) ;
- Koh, Hee-Seog (Dept. of Electrical Eng. Kyung Nam University)
- Published : 1995.07.20
Abstract
This paper describes analysis and optimization of Weil-Dobke synthetic testing circuit parameters, which is efficient and economical test method in high capacity AC circuit breaker. In this paper, analysis of synthetic short-circuit test circuit parameter proposed nondimensional factor that is reciprocal comparison value of circuit parameter and is not related to rated of circuit breaker, in particular, this study induce minimization of required energy of critical TRV generation specified in IEC 56 standards and present optimal design of synthetic short circuit testing facilities.
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