Effect of $SiF_4$ addition on the structures of silicon films deposited at low temperature by remote plasma enhanced chemical vapor deposition

  • Xiaodong-Li (Department of Metals and Technology, Harbin Institute of Technology) ;
  • Park, Young-Bae (Laboratory for Advanced Materials pprocessing (LAMpp), Deppartment of Chemical Engineering ppohang University of Science and Technology(POSTECH)) ;
  • Kim, Dong-Hwan (Laboratory for Advanced Materials pprocessing (LAMpp), Deppartment of Chemical Engineering ppohang University of Science and Technology(POSTECH)) ;
  • Rhee, Shi-Woo (Laboratory for Advanced Materials pprocessing (LAMpp), Deppartment of Chemical Engineering ppohang University of Science and Technology(POSTECH))
  • Published : 1995.06.01