Electrical and Memory Switching Characteristics of Amorphous Thin-Film $As_{10}Ge_{15}Te_{75}$ Thin-Film

비정질 $As_{10}Ge_{15}Te_{75}$ 박막의 전기적 및 메모리 스위칭 특성

  • 이병석 (광운대학교 전자재료공학과 광운대학교 신기술 연구소) ;
  • 이현용 (광운대학교 전자재료공학과 광운대학교 신기술 연구소) ;
  • 정흥배 (광운대학교 전자재료공학과 광운대학교 신기술 연구소)
  • Published : 1996.11.01

Abstract

The amorphous chalogenide semiconductors are new material in semiconductor physics. Their properties, especially electronic and optical properties are main motives for device application. Amorphous As$_{10}$Ge$_{15}$ Te$_{75}$material has the stable ac conductivity at high frequency and the dc memory switching property. At higher frequency than 10MHz, ac conductivity of As$_{10}$Ge$_{15}$ Te$_{75}$ thin film is much higher than below frequency and independent of temperature and frequency. If the dc voltages are applied between edges of thin film, one can see the dc memory switching phenomenon, in other words the dc conductivity increases quite a few of magnitude after the threshold voltage is applied. Using the stable ac conductivity at high frequency and the increase of conductivity after dc memory switching, As$_{10}$Ge$_{15}$ Te$_{75}$thin film is considered as new material for microwave switch devices.vices.es.vices.

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