Surface Chracterization of poly(p-phenylenevinylene) and its derivatives, MEH-PV and DMOS-PPV, using XPS, Static SIMS and ToF-SIMS

  • Kim, Seung-Hee (LG Corpporate Institute of Technology) ;
  • Kim, T.H. (LG Corpporate Institute of Technology) ;
  • Lee, J.W. (LG Corpporate Institute of Technology)
  • 발행 : 1997.02.01