Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference (한국전기전자재료학회:학술대회논문집)

The Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회)
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Loss Analysis and Preparation of Ti:LiNbO$_3$Optical Waveguide as a Function of Ti Thickness

Ti 두께에 따른 Ti:LiNbO$_3$광도파로 특성 및 손실분석

  • Jung, Won-Jo (Dept. of INFORM. & TELECOM., HanLyo University) ;
  • Kim, Seong-Ku (Korea Electronics Technology Institute(KETI)) ;
  • Jung, Young-Gun (KumHo Information & Telecommunications Lab) ;
  • Kang, Byeong-Mo (Dept. of Electronics Eng., Chunnam University) ;
  • Cho, Jae-Cheol (Dept. of Electronics Eng.,ChoDang University) ;
  • Park, Kye-Choon (Major in Electronic Eng.,Division of Information Eng., Mokpo University) ;
  • Lee, Jin (Major in Electronic Eng.,Division of Information Eng., Mokpo University) ;
  • Yoo, Yong-Taek (Dept. of Electronics Eng., Chunnam University)
  • 정운조 (한려대학교 정보통신학과) ;
  • 김성구 (전자부품종합기술연구소) ;
  • 정용근 (금호정보통신연구소) ;
  • 강병모 (전남대학교 전자공학과) ;
  • 조재철 (초당대학교 전자공학과) ;
  • 박계춘 (목포대학교 정보공학부 전기공학전공) ;
  • 이진 (목포대학교 정보공학부 전기공학전공) ;
  • 유용택 (전남대학교 전자공학과)
  • Published : 1997.11.01
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Abstract

Ti:LiNbO$_3$optical waveguides were fabricated as a function of Ti thickness and pigtailed with polarization maintaining fiber(PMF). The near field patterns and total insertion loss of these sample was showed and measured for optical wavelength 1550nm. The fiber-to-waveguide coupling loss was described also .

Keywords