Effect of Post Annealing of Amorpphous SiC Thin Films using by PECVD

  • 홍성의 (재료기술연구실, Electronics and Telecommunications Research Institute) ;
  • 이해권 (재료기술연구실, Electronics and Telecommunications Research Institute) ;
  • 백문철 (재료기술연구실, Electronics and Telecommunications Research Institute)
  • 발행 : 1998.06.01