EFFECT OF ANNEALING ATMOSPHERE ON THE DELAMINATION OF Pt LAYER IN SiO$_2$/Pt/PZT/Pt STRUCTURE

  • Park, Young-Soo (Samsung Advanced Institute of Technology, Electronic Materials Laboratory) ;
  • Chung, Chee-Won (Samsung Advanced Institute of Technology, Electronic Materials Laboratory) ;
  • Lee, June-Key (Samsung Advanced Institute of Technology, Electronic Materials Laboratory) ;
  • Chung, Il-Sub (Samsung Advanced Institute of Technology, Electronic Materials Laboratory)
  • Published : 1998.08.01