Nanometer-scale Imaging in Thin Films by Scanning Maxwell-stress Microscopy

주사형 맥스웰 응력 현미경을 이용한 박막의 Nanometer-scale 이미지

The scanning Maxwell-stress microscopy (SMM) is a dynamic noncontact electric force microscopy that allows simultaneous access to the electrical properties of molecular system such as surface potential, surface charge, dielectric constant and conductivity along with the topography. Here we report our recent results of its application to nanoscopic study of domain structures and electrical functionality in organic thin films prepared by the Langmuir-Blodgett technique.