A Study on the Implementation of LCD Defect Inspection Algorithm

LCD 결함검사 알고리즘에 관한 연구

In this Paper we show the LCD simulator for defect inspection using image processing algorithm and neural network. The defect inspection algorithm of the LCD consists of preprocessing, feature extraction and defect classification. Preprocess removes noise from LCD image, using morphology operator and neural network is used for the defect classification. Sample images with scratch, pinhole, and spot from real LCD color filter image are used. The proposed algorithms show that defect detected and classified in the ratio of 92.3% and 94.6 respectively.