도체접속부 열화에 대한 수명온도상승 모델

Lifetime Temperature Rise Model for the Degradation of Electric Connections/Contacts

In this study in order to find out the trends and the residual lifetime for electric connections/contacts using infrared image camera, "lifetime temperature rise model" is theoretically proposed on the base of "lifetime resistance model" and to prove this theory, experiments have been performed for various kinds of electric connections/contacts. Two suggestions have been builded up or the "lifetime temperature rise model" ; one is the linear relationship between the temperature rise $\Delta K$ and contact resistance, and the other is the functional relationship between the temperature of electric connections/contacts and the operating time which ascribed in the "lifetime resistance model". From the experimental results, measured values were quite similar to the theoretical value so that two suggestions in "lifetime temperature rise model" were appeared to be correct.