Proceedings of the KIEE Conference (대한전기학회:학술대회논문집)
- 2000.07c
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- Pages.1611-1613
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- 2000
Lifetime Temperature Rise Model for the Degradation of Electric Connections/Contacts
도체접속부 열화에 대한 수명온도상승 모델
- Kim, Jeong-Tae (Daejin Univ.) ;
- Kim, Ji-Hong (Hanyang Univ.) ;
- Koo, Ja-Yoon (Hanyang Univ.) ;
- Yoon, Ji-Ho (LG Industrial Systems) ;
- Ham, Gil-Ho (LG Industrial Systems)
- 김정태 (대진대학교 전기공학과) ;
- 김지홍 (한양대학교 전기공학과) ;
- 구자윤 (한양대학교 전기공학과) ;
- 윤지호 (LS 산전 (주) 전력시험기술센터) ;
- 함길호 (LS 산전 (주) 전력시험기술센터)
- Published : 2000.07.17
Abstract
In this study in order to find out the trends and the residual lifetime for electric connections/contacts using infrared image camera, "lifetime temperature rise model" is theoretically proposed on the base of "lifetime resistance model" and to prove this theory, experiments have been performed for various kinds of electric connections/contacts. Two suggestions have been builded up or the "lifetime temperature rise model" ; one is the linear relationship between the temperature rise
Keywords