A Study on Diagnostic Technics for Thyristor

Thyristor 성능 진단기술에 관한 연구

In general, the expected life of power semiconductor elements is known for semi-permanent, but actual characteristics are changed according to the such environment conditions obviously because of using time or operating condition. Specially, in case of using at the power plant it is very important to sustain reliability for power semiconductor which it affect to stop operating condition as deterioration or break. Therefore, we need to apply maintenance technics to got the reliability which is a prediction method of life cycle. This paper shows the result of the analyzed data for element characteristic and effects used practically and we had developed the effective equipment which for diagnostic the semiconductor performance.