Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference (한국전기전자재료학회:학술대회논문집)

The Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회)
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Polarization recording and reconstruction in the chalcogenide As-Ge-Se-S thin films.

비정질 칼코게나이드 As-Ge-Se-5 박막에서 편광기록 및 재생

  • 장선주 (광운대학교 전자재료공학과) ;
  • 손철호 (광운대학교 전자재료공학과) ;
  • 여철호 (광운대학교 전자재료공학과) ;
  • 박정일 (광운대학교 전자재료공학과) ;
  • 이영종 (여주대학 전자공학과) ;
  • 정흥배 (광운대학교 전자재료공학과)
  • Published : 2000.07.01
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Abstract

In this study, we have investigated the holography recording and reconstruction of the polarization state in chalcogenide $As_{40}$$Ge_{10}$$Se_{15}$$S_{35}$ thin films using a He-Ne laser light(633nm). The thickness of thin films is a 8677${\AA}$ and 9093${\AA}$. A He-Ne laser used to probe and record of the grating. Also the, polarization state of object beam modulated with a $\lambda/4$ wave plate. The polarization state of the +1st order diffracted beam generated by readout of the grating with a linearly polarized reference beam. It was the same-handed polarization state as the polarization state of the recording beam. The diffraction efficiency of circularly polarized recording represented higher than other polarization state.

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