Dependency of etched film thickness on the magnetic and structural properties of air-annealed FePt thin films

  • K. H. Na (Thin Film Technology Research Center, KIST) ;
  • J. G. Na (Thin Film Technology Research Center, KIST) ;
  • P. W. Jang (Dept. of Physics, Chongju university) ;
  • Lee, S. R. (Korea University Div. of Materials Science and Engineering)
  • Published : 2000.09.01