In-situ Fluorine Passivation by Excimer Laser Annealing

  • Jung, Sang-Hoon (School of Electrical Engineering, Seoul National University) ;
  • Kim, Cheon-Hong (School of Electrical Engineering, Seoul National University) ;
  • Jeon, Jae-Hong (School of Electrical Engineering, Seoul National University) ;
  • Yoo, Juhn-Suk (School of Electrical Engineering, Seoul National University) ;
  • Han, Min-Koo (School of Electrical Engineering, Seoul National University)
  • 발행 : 2000.01.13

초록

We propose a new in-situ fluorine passivation of poly-Si TFTs by excimer laser annealing to reduce the trap density and improve the reliability significantly. This improvement is due to the formation of stronger Si-F bonds than Si-H bonds which passivate the trap states.

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