Theoretical Study of d/p Margin

  • Oh, Jun-Sik (Technology Division, Samsung Display Devices Co., Ltd.) ;
  • Lee, Han-Yong (Technology Division, Samsung Display Devices Co., Ltd.)
  • Published : 2000.01.13

Abstract

We have calculated the d/p boundary values in which the low twist defect and the stripe domain defect can occur with dielectric constants and elastic constants and compared them with experimental data using the compensation factors. We estimated d/p margin for $250^{\circ}$ twist angle without experimental data and investigated qualitatively the reasonability of the behavior.

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