한국정보디스플레이학회:학술대회논문집

한국정보디스플레이학회 (The Korean Infomation Display Society)
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Application of Rotating Polarizer Method to Low LC Cell Gap Measurement

  • Kim, Chang-Son (Dept. of Electronics Engineering, Pusan National University) ;
  • Lee, Gi-Dong (Dept. of Electronics Engineering, Pusan National University) ;
  • Yoon, Tae-Hoon (Dept. of Electronics Engineering, Pusan National University) ;
  • Kim, Jae-Chang (Dept. of Electronics Engineering, Pusan National University)
  • 발행 : 2000.01.13
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초록

Measurement of low cell gap and retardation by using a rotating polarizer method was proposed. For more precise calculation and measurement, we applied a retardation film that has large retardation value of $1\;{\mu}m$ to measurement system. From experiments, we proved that cell gap and retardation could be measured even though the values of those are so small.

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