대한전기학회:학술대회논문집 (Proceedings of the KIEE Conference)
- 대한전기학회 2001년도 하계학술대회 논문집 A
- /
- Pages.38-40
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- 2001
디지털 측정 및 분석장치의 적용에 관한 연구
Consideration on data acquisition and analysis system for using short-circuit tests
-
김맹현
(한국전기연구원 산업협력부)
;
-
서윤택
(한국전기연구원 산업협력부)
;
- 김대원 (한국전기연구원 산업협력부) ;
-
강영식
(한국전기연구원 산업협력부)
;
- 고희석 (경남대학교 전기전자공학부)
-
Kim, M.H.
(Testing & Industrial Services Division of KERI)
;
-
Suh, Y.T.
(Testing & Industrial Services Division of KERI)
;
- Kim, D.W. (Testing & Industrial Services Division of KERI) ;
-
Kang, Y.S.
(Testing & Industrial Services Division of KERI)
;
- Koh, H.S. (Electrical Engineering Department of Kyungnam)
- 발행 : 2001.07.18
초록
Measuring technology based on the computer and software is used worldwideiy by the aids of remarkably improved digital technology and measuring devices, and the electro- magnetic interference due to high currents and high voltages is being solved by the helps of applied optic instrumentation technology. The automatic acquisition, analysis and storage system of test data is available for utilizing the numerical computation technology. The measuring accuracy and testing efficiency are thus much higher because of the developed technologies. In this paper, the construction of data acquisition system in KERI including measuring devices and its application to the short circuit test are described, and additionally the algorithm of the analyzing program for the automatic process of test data and the results of analyses are described.
키워드