The Dielectric Characteristics of BST Thin Film Devices

BST 박막 소자의 유전특성

  • 홍경진 (광주대학교 컴퓨터전자통신공학부) ;
  • 민용기 (광주대학교 컴퓨터전자통신공학부) ;
  • 신훈규 (동아대학교 지능형 통합만관리 연구센터) ;
  • 조재철 (초당대학교 전자공학과)
  • Published : 2001.07.01

Abstract

The devices of BST thin films to composite (Ba$\_$0.7/ Sr$\_$0.3/)TiO$_3$using sol-gel method were fabricated by changing of the depositing layer number on Pt/Ti/SiO$_2$/Si substrate. The thin film capacitor to be ferroelectric devices was investigated by structural and electrical properties. The thickness of BST thin films at each coating numbers 3, 4 and 5 times was 2500[${\AA}$], 3500[${\AA}$], 3800[${\AA}$]. The dielectric factor of thin film when the coating numbers were 3, 4 and 5 times was 190, 400 and 460 on frequency 1[MHz]. The dielectric loss of BST thin film was linearly increased by increasing of the specimen area.

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