Effects of Cu or Bi Additions on the Creep Properties of the Sn-3.5Ag Solder Alloys

  • Shin, S.W. (Center for Electronic Packaging Materials Department of Mater, Sci. & Eng. KAIST) ;
  • Joo, D.K. (Center for Electronic Packaging Materials Department of Mater, Sci. & Eng. KAIST) ;
  • Yu, Jin (Center for Electronic Packaging Materials Department of Mater, Sci. & Eng. KAIST)
  • Published : 2001.07.01