Detecting the Multiful Dynamic Signals on IEEE 1149.1 Structure

IEEE 1149.1 구조에서 다중 동적 신호 검출

A key advantage of boundary scan technology is the ability to observe data at device inputs and control data at device outputs, independent of on-chip system logic. But, this method has a disadvantage for detecting of faults that changes their states very fast. We present a method to solve this problem and make it possible to detect the signals. We shown the simulation results of testing a circuit that has fast signal above the clock speed.