Proceedings of the IEEK Conference (대한전자공학회:학술대회논문집)

The Institute of Electronics and Information Engineers (대한전자공학회)
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Design Controller For Rapidity Temperature Measurement-system

넓은 영역의 온도범위를 가지는 급속 온도특성측정시스템 컨트롤러 설계

  • 신광식 (동서대학교 인터넷 공학부) ;
  • 정완영 (동서대학교 인터넷 공학부)
  • Published : 2001.06.01
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Abstract

An automatic TCXO frequency-temperature test apparatus was firstly developed by using thermoelectric device may. The developed system swing stably the test temperature range from -40$^{\circ}C$ to +80$^{\circ}C$ for about 1 hour The rising temperature ratio was fairly linear with time in this test temperature range. The temperature could be controlled error in error range of ${\pm}$0.05$^{\circ}C$ in this system. The frequency-Temperature properties of TCXO or the thermoelectric properties of other electric device.

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