대한전자공학회:학술대회논문집 (Proceedings of the IEEK Conference)

대한전자공학회 (The Institute of Electronics and Information Engineers)
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Boundary Extraction Using Statistical Edge and Curvature Model

  • Park, Hae-Chul (KAIST Dept. of Electrical Engineering) ;
  • Lee, J. S. (KAIST Dept. of Electrical Engineering) ;
  • H. C. Shin (KAIST Dept. of Electrical Engineering) ;
  • J. H. Cho (KAIST Dept. of Electrical Engineering) ;
  • Kim, S. D. (KAIST Dept. of Electrical Engineering)
  • 발행 : 2001.09.01
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초록

We propose an algorithm for extracting the boundary of an object. In order to take full advantage of global shape, our approach uses global shape parameters derived from Point Distribution Model (PDM). Unlike PDM, the proposed method models global shape using curvature as well as edge. The objective function of applying the shape model is formulated using Bayesian rule. We can extract the boundaries of an object by evaluating iteratively the solution maximizing the objective function. Experimental results show that the proposed method can reduce computation cost than the PDM and it is robust to noise, pose variation, and some occlusion.

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