STM Observation Of Stress-Induced Leakage Current Sites In The Ultra Thin Oxide On Si Surface.

• Shin, Ji-Shik (Institute of Physics and Applied Physics (IPAP) and Atomic-scale Surface Science Research Center (ASSRC), Yonsei University) ;
• Jung, Jong-Hoon (Institute of Physics and Applied Physics (IPAP) and Atomic-scale Surface Science Research Center (ASSRC), Yonsei University) ;
• Moon, Ki-Young (Institute of Physics and Applied Physics (IPAP) and Atomic-scale Surface Science Research Center (ASSRC), Yonsei University) ;
• Ryu, Jea-Choon (Institute of Physics and Applied Physics (IPAP) and Atomic-scale Surface Science Research Center (ASSRC), Yonsei University) ;
• Lyo, In-Whan (Institute of Physics and Applied Physics (IPAP) and Atomic-scale Surface Science Research Center (ASSRC), Yonsei University)

• 신지식 ;
• 정종훈 ;
• 문기영 ;
• 유재춘 ;
• 여인환

• Published : 2001.02.22

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