Thermal Design of IGBT Module with Respect to Stability

IGBT소자의 열적 안정성을 고려한 방열설계

  • Lee Joon-Yeob (Electro-Mechanical Research Institute, Hyundai Heavy Industries., Co. Ltd.) ;
  • Song Seok-Hyun (Electro-Mechanical Research Institute, Hyundai Heavy Industries., Co. Ltd.)
  • 이준엽 (현대중공업㈜ 기계전기연구소) ;
  • 송석현 (현대중공업㈜ 기계전기연구소)
  • Published : 2002.11.01

Abstract

Thermal design is required with considering thermal stability to verify the reliability of electric power device with using IGBT. Numerical analysis is performed to analyzed the change in thermal resistance with respect to the various thermal density of heating element. Correlations between thermal resistance and heat generation density are established. With using these correlations, performance curve is composed with respect to the change in thermal resistance of cooling conditions for natural convection and forced convection. Thermal fatigue is occurred at the Inside and outside of IGBT by repeated heat load. The crack is occurred between base plate and ceramic substrate for the inside. When the crack length is 4mm, the failure is occurred. Therefore, Thermal design method considering thermal density, thermal fatigue resistance is presented on this study and it is expected to thermal design with considering life prediction.

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