A Implementation of a Line Scan System for Continuous Manufacturing Process

연속 생산 라인에서의 고속 라인 스캔 검사 시스템 구축

  • 임청 (아주대학교 전자공학부) ;
  • 이종민 (아주대학교 전자공학부) ;
  • 김용득 (아주대학교 전자공학부)
  • Published : 2002.06.01

Abstract

Under a continuous manufacturing process, two dimension inspection system causes problems as blurring effect and low resolution and requires position calibration between frames. One dimension inspection system is, therefore, being researched as a substitution. In this paper, we implement mechanism of switching memory and processing data for reasonable one dimension inspection system. Redundant weft image and noise was suggested to be reduced by new method using modified morphological process and masked erosion process. From resulting image, line data and possible error information were obtained and constructed as a structure. Finally, error detecting algorithm was performed with this data structure. Processing time of error detecting was 0.625ms per line in applied system and experiment showed 94.7% of error detecting ability. This method is 20% faster in speed and 2.7% higher in error detecting ability comparing with the present method.

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