Sense Amplifier Design for A NOR Type Non-Volatile Memory

  • Yang, Yil-Suk (Basic Research Laboratory, Electronics and Telecommunications Research Institute) ;
  • Yu, Byoung-Gon (Basic Research Laboratory, Electronics and Telecommunications Research Institute) ;
  • Roh, Tae-Moon (Basic Research Laboratory, Electronics and Telecommunications Research Institute) ;
  • Koo, Jin-Gun (Basic Research Laboratory, Electronics and Telecommunications Research Institute) ;
  • Kim, Jongdae (Basic Research Laboratory, Electronics and Telecommunications Research Institute)
  • Published : 2002.07.01

Abstract

We have investigated the precharge type sense amplifier, it is suitable fur voltage sensing in a NOR type single transistor ferroelectric field effect transistor (1T FeFET) memory read operation. The proposed precharge type sense amplifier senses the bit line voltage of 1T FeFET memory. Therefore, the reference celt is not necessary compared to current sensing in 1T FeFET memory, The high noise margin is wider than the low noise margin in the first inverter because requires tile output of precharge type sense amplifier high sensitivity to transition of input signal. The precharge type sense amplifier has very simple structure and can sense the bit line signal of the 1T FeFET memory cell at low voltage.

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