Impedance spectroscopy for lifetime analysis of OLED

The frequency response analysis of complex impedance spectra using small perturbation ac impedance spectroscopy is an informative method of OLED performance characterization and lifetime analysis. Using simple RC equivalent circuit mode,l macroscopic nonliniear transport properties of semiconductive emission/transport layers can be analyzed and parameterized. We present the bias voltage dependence and aging effect in impedance spectra measured from an ITO/CuPC/TPD/$Alq_3$/LiF/Al OLED device, and discuss possible failure mechanism based on impedance model parameters.