한국정보디스플레이학회:학술대회논문집

한국정보디스플레이학회 (The Korean Infomation Display Society)
권호 표지

A Study on the Accelerated Life-time Test method Of MgO thin film in the AC PDP

  • Park, Chung-Hoo (Department of Electrical Engineering, Pusan National University) ;
  • Choi, Min-Seok (Department of Electrical Engineering, Pusan National University) ;
  • Choi, Joon-Young (Department of Electrical Engineering, Pusan National University) ;
  • Kim, Dong-Hyun (Department of Electrical Engineering, Pusan National University) ;
  • Lee, Ho-Jun (Department of Electrical Engineering, Pusan National University)
  • 발행 : 2002.08.21
PDF 다운로드
⟨ 이전 논문 다음 논문 ⟩

초록

In this paper, an accelerated lifetime test method of MgO thin film is suggested. The most important test factors are surface temperature of the PDP, gas pressure, the applied voltage and frequency. The standard test conditions are $50^{\circ}C$, 400Torr, 20% over voltage and 300kHz ,respectively. The accelerated lifetime of MgO is significantly varied with the MgO preparing conditions.

키워드