The influences of film density on hydration of MgO protective layer in plasma display panel

  • Lee, Jung-Heon (School of Materials Science & Engineering, Seoul National Univ.) ;
  • Eun, Jae-Hwan (School of Materials Science & Engineering, Seoul National Univ.) ;
  • Park, Sun-Young (School of Materials Science & Engineering, Seoul National Univ.) ;
  • Kim, Soo-Gil (Department of Electronics Engineering, Kyungwon Univ.) ;
  • Kim, Hyeong-Joon (School of Materials Science & Engineering, Seoul National Univ.)
  • 발행 : 2002.08.21

초록

We report the effect of density of thin films on moisture adsorption and hydration of MgO thin film, usually used as a protective layer in AC-PDP After hydration, lots of hemispherical shaped clusters, $Mg(OH)_2$, formed on the surface of MgO thin films. However clusters formed on low-density thin films were bigger than those on high-density films. From ERD spectra, it seemed that the concentration of hydrogen was very high in the region 20 nm from the surface of MgO thin film. The low-density thin film had more hydrogen than high-density thin film. From simulation results of ERD and RBS it was found that hydration reaction also occurred in the inner part of the film. So diffusion of Mg atoms from the inner part of the film to the surface and $H_2O$ molecules from the surface to the inner part of the film is important. And because low density thin film has many short paths for diffusion of Mg atoms and $H_2O$ molecules, low-density thin film is more hydrated. So to suppress hydration of MgO thin films, high-density thin film is needed.

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