한국정보디스플레이학회:학술대회논문집
- 2002.08a
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- Pages.395-398
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- 2002
New analysis method of electrostatic lens for CRT
- Seok, J.M. (Components R & D Team, ORION ELECTRIC CO., LTD.) ;
- Ham, Y.S. (Components R & D Team, ORION ELECTRIC CO., LTD.) ;
- Lee, J.I. (Components R & D Team, ORION ELECTRIC CO., LTD.)
- Published : 2002.08.21
Abstract
The spherical aberration and optical integer (f) of the electron gun's main lens in color CRT is obtained, using electron beam trajectory. A spherical aberration is obtained from the relation between the object plane and the image of a beam trajectory. To analyze beam profile, 3rd and 1st order coefficient were obtained and used. It is shown that, in practice, they are applied to electron gun design.
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