New Current-Voltage Model for Statistically Distributed Field Emitters

  • Lee, Myoung-Bok (School of Electronic and Electrical Engineering, Kyungpook National University) ;
  • Lee, Jae-Hoon (School of Electronic and Electrical Engineering, Kyungpook National University) ;
  • Kwon, Ki-Rock (School of Electronic and Electrical Engineering, Kyungpook National University) ;
  • Hahm, Sung-Ho (School of Electronic and Electrical Engineering, Kyungpook National University) ;
  • Lee, Jong-Hyun (School of Electronic and Electrical Engineering, Kyungpook National University) ;
  • Lee, Jung-Hee (School of Electronic and Electrical Engineering, Kyungpook National University)
  • Published : 2002.08.21

Abstract

For the I-V modeling of sharp tip arrays and nanostructured planar emitters, we propose a new and much practical I-V relation including tip height and radius by considering a statistical distribution of tip radius. Frequently observed nonlinearity of Fowler-Nordheim plot for sharp tip and tip arrays was successfully simulated and then, an application example was provided to extract relevant emission-governing parameters of sharp tip.

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