Investigation on core loss characteristics of $3\%$ SiFe by using the laser scribing method

  • Ahn Seungjoon (Department of Physics/Center for Next Generation Semiconductor Technology, Sun Moon University) ;
  • Kim Dae-Wook (Department of Physics/Center for Next Generation Semiconductor Technology, Sun Moon University) ;
  • Kim Ho Seob (Department of Physics/Center for Next Generation Semiconductor Technology, Sun Moon University) ;
  • Baik Kwang-Hyun (Department of e-Business, Sun Moon University) ;
  • Ahn Seong Joon (Division of Electronics, I & C Engineering, Sun Moon University) ;
  • Kim Chul Gi (Department of Materials Science and Engineering, Chungnam National University)
  • Published : 2003.12.01