Structural Change of SAM-Covered Au(111) Surface by STM Tip and Sample Interaction

  • Kim Jooyoung (Department of Electric and Electronic Engineering, Toyohashi University of Technology) ;
  • Nishimura Kazuhiro (Department of Electric and Electronic Engineering, Toyohashi University of Technology) ;
  • Uchida Hironaga (Department of Electric and Electronic Engineering, Toyohashi University of Technology) ;
  • Inoue Mitsuteru (Department of Electric and Electronic Engineering, Toyohashi University of Technology)
  • Published : 2003.12.01