대한전자공학회:학술대회논문집 (Proceedings of the IEEK Conference)

대한전자공학회 (The Institute of Electronics and Information Engineers)
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기하학적 패턴 매칭을 이용한 3차원 비전 검사 알고리즘

3D Vision Inspection Algorithm Using the Geometrical Pattern Matching

  • 정철진 (단국대학교 전자. 컴퓨터공학과) ;
  • 허경무 (단국대학교 전자공학과)
  • 발행 : 2003.07.01
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초록

In this paper, we suggest the 3D Vision Inspection Algorithm which is based on the external shape feature, and is able to recognize the object. Because many objects made by human have the regular shape, if we posses the database of pattern and we recognize the object using the database of the object's pattern, we could inspect the objects of many fields. Thus, this paper suggest the 3D Vision inspection Algorithm using the Geometrical Pattern Matching by making the 3D database.

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