한국정보디스플레이학회:학술대회논문집
- 2003.07a
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- Pages.109-112
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- 2003
The comparison and analysis on the phosphor degradation causes in ac PDP
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Ha, Chang-Hoon
(School of Electrical & Computer oEngineering, Seoul National University)
;
- Jeong, Dong-Chul (School of Electrical & Computer oEngineering, Seoul National University) ;
- Kim, Tae-Jun (School of Electrical & Computer oEngineering, Seoul National University) ;
- Bae, Hyun-Sook (School of Electrical & Computer oEngineering, Seoul National University) ;
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Whang, Ki-Woong
(School of Electrical & Computer oEngineering, Seoul National University)
- Published : 2003.07.09
Abstract
In this paper, we investigated the phosphor degradation characteristics on the ultra violet ray (UV) irradiation as well as ion bombardment. We propose a novel experiment method which is related with phosphor degradation causes. The phosphor deterioration experiments were made on the UV irradiation as well as ion bombardment. To carry out the experiment and compare the results, we made up the specific experimental setup. The results show that the deterioration by ion damage is more rigorous than that by vacuum ultra violet (VUV) on the phosphor efficiency.
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