Thermal annealing for long-term stability of polymer light-emitting devices

  • Kim, Jin-Ook (Research and Development Center, LG.Philips LCD) ;
  • Park, Jong-Hyn (Research and Development Center, LG.Philips LCD) ;
  • Lee, Jae-Yoon (Research and Development Center, LG.Philips LCD) ;
  • Lee, N.Y. (Research and Development Center, LG.Philips LCD) ;
  • Chung, In-Jae (Research and Development Center, LG.Philips LCD)
  • Published : 2003.07.09

Abstract

Thermal annealing of a polymer light-emitting diode (PLED) is shown to result in a remarkable improvement in the long-term stability of the device. The best half-life is obtained at an annealing temperature above the $T_g$ of emitting polymer. It is shown that the annealing of the emitting polymer layer results in a more than an order of magnitude increase in the half-life in spite of a decrease in the efficiency of the device as the annealing temperature increases.$^1$

Keywords