Characterization of the 2 inch CNT-FED Fabricated by using a Vacuum In-Line Sealing Technology

  • Kwon, Sang-Jik (Dept. of Electronics Eng., Kyungwon University) ;
  • Kim, Tae-Ho (Dept. of Electronics Eng., Kyungwon University) ;
  • Cho, Euo-Sik (Inter-University Semiconductor Research Center(ISRC) and School of Electrical Engineering, Dept. of Electrical Engineering and Computer Science, Seoul National University) ;
  • Shon, Byeong-Kyoo (Dept. of Electronics Eng., Kyungwon University) ;
  • Uh, Hyung-Soo (Dept. of Electronics Eng., Sejong University) ;
  • Lee, Jong-Duk (Inter-University Semiconductor Research Center(ISRC) and School of Electrical Engineering, Dept. of Electrical Engineering and Computer Science, Seoul National University) ;
  • Cho, Sung-Hee (Technology Development 3, Corporate R&D Center, Samsung SDI) ;
  • Lee, Chun-Gyoo (Technology Development 3, Corporate R&D Center, Samsung SDI)
  • Published : 2003.07.09

Abstract

We have fabricated a carbon nanotube field emission display(CNT FED) panel with a 2 inch diagonal size by using screen printing method and vacuum in-line sealing technology. The sealing temperature of the panel was around 390 $^{\circ}C$ and the leak test was carried out for 72 hrs after sealing process. When field emission properties of fabricated and sealed CNT FED panel were characterized and compared with those of unsealed panel which was located in vacuum chamber of vacuum level similar with the sealed panel, the sealed panel showed more improved field emission properties.

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