Effects of $LaNiO_3$ Buffer Layers Thickness on the Ferroelectric Properties of PZT Thin Film

  • Kim, Hee-San (Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology) ;
  • Kim, J.H. (Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology) ;
  • Choo, W.K. (Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology)
  • 발행 : 2003.04.18