Proceedings of the KIEE Conference (대한전기학회:학술대회논문집)

The Korean Institute of Electrical Engineers (대한전기학회)
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Pattern Matching for Automatic Defects Detection of the Light Guide Panel

도광판의 자동 결함 검출을 위한 패턴 매칭

  • 조상희 (선문대학교 전자공학) ;
  • 박영덕 (선문대학교 정보통신) ;
  • 오춘석 (선문대학교 전자정보통신공학부) ;
  • 유영기 (선문대학교 전자정보통신공학부)
  • Published : 2004.11.12
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Abstract

As the demand of large and high-resolution display panels is increased, the black light units (BLU) of the display devices play an important roles. In this study we'll deal with various defects of BLUs. Patterns of defects can be classified by the scratches, the non-uniform misprinting for the diffused reflection, the surface stains, spots and etc. Due to these distorted patterns the high-resolution and high-precision could be impeded. We'll propose the visual inspection system to detect various defects by pattern-matching.

Keywords