Proceedings of the KIEE Conference (대한전기학회:학술대회논문집)
- 2004.11b
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- Pages.131-133
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- 2004
The Development of Assistant Application for Short-circuit Tests
단락시험 회로정수 계산용 어플리케이션 개발
- Oh, Seung-Ryle (PT&T, LG Industrial Systems, Co., Ltd.) ;
- Na, Chil-Bong (PT&T, LG Industrial Systems, Co., Ltd.) ;
- Park, Ji-Hun (PT&T, LG Industrial Systems, Co., Ltd.) ;
- Park, Jong-Wha (PT&T, LG Industrial Systems, Co., Ltd.)
- 발행 : 2004.11.12
초록
A improving method of the time efficiency to be necessary during the short-circuit tests that use high-priced equipment. Minimizing a human error through the database of relevant standards prospects a reliable tests. This paper describes the design concept and overall process of the development of the application that is developed in order to realize these functions.
키워드