한국정보디스플레이학회:학술대회논문집
- 2004.08a
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- Pages.951-954
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- 2004
Reliability Tests on SpatiaLight's LCOS Microdisplays
- Shin, Dong-Soo (Department of Applied Physics, Hanyang University) ;
- Sun, Raymond (SpatiaLight, Inc.) ;
- Jin, Michael (SpatiaLight, Inc.)
- Published : 2004.08.23
Abstract
We report the recent reliability test results of SpatiaLight's liquid crystal on Silicon (LCOS) microdisplays. Two different types of reliability tests have been performed: 1) thermal and 2) thermal with high intensity UV light. Various important device parameters were regularly monitored including the contrast ratio, color uniformity, and switching time. The test data shows that there are no degradations that fail the pass criteria. Lifetime estimations are given from the test data.
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