Nonlinear Dynamics at the Nanoscale

나노스케일에서의 비선형 동역학

  • 이수일 (서울시립대학교 기계정보공학과) ;
  • 홍상혁 (서울대학교 대학원 기계항공공학부) ;
  • 박준형 (서울대학교 정밀기계설계공동연구소) ;
  • 이장무 (서울대학교 공과대학 기계항공공학부)
  • Published : 2004.11.01

Abstract

AFM(Atomic Force Microscope) becomes a versatile tool in the nanoscale measurements and processes. Especially the tapping mode is a very useful mode in AFM operation to measure and process at the nanoscale. Although the tapping mode has a great potential for the novel techniques such as phase imaging, however, it is not clearly known the fundamental mechanics affected by complex tip-sample interactions. This paper shows the various nonlinear dynamic features in tapping mode AFM microcantilevers including hysteretic jumps and period doublings of the microcantilevers. Also it is discussed the complex dynamics of CNT(Carbon Nanotube) probes and the opportunities on the nanoscale nonlinear dynamics.

Keywords