Switching Issues for High Density MRAM

  • Kim K. (Nano Devices Lab, Samsung Advanced Institute of Technology) ;
  • Cho Y.J. (Nano Fabrication Center, Samsung Advanced Institute of Technology) ;
  • Hwang I.J. (Nano Fabrication Center, Samsung Advanced Institute of Technology) ;
  • Kim K.S. (Materials Science and Engineering, Gwangju institute of Science & Technology) ;
  • Jeong W.C. (Advanced Technology Development Team, Semiconductor R&D Division) ;
  • Lee J.E. (Process Development Team, Semiconductor R&D Division) ;
  • Kim T W. (Nano Devices Lab, Samsung Advanced Institute of Technology)
  • Published : 2005.12.01