한국정보디스플레이학회:학술대회논문집

한국정보디스플레이학회 (The Korean Infomation Display Society)
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Analysis and Remedy of TFT Based Current Mode Logic Circuit Performance Degradation due to Device Parameter Fluctuation

  • Lee, Joon-Chang (Dept. of Electronic Engineering, The University of Suwon) ;
  • Jeong, Ju-Young (Dept. of Electronic Engineering, The University of Suwon)
  • 발행 : 2005.07.19
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초록

We report the influence of the threshold voltage and mobility fluctuation in TFT on current mode digital circuit performance. We found that the threshold voltage showed more serious circuit malfunction. We studied new circuit configuration for improvement.

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