한국정보디스플레이학회:학술대회논문집

한국정보디스플레이학회 (The Korean Infomation Display Society)
권호 표지

A new method for measuring ultra-low water vapor permeation for OLED displays

  • Dunkel, Ralf (General Atomics, 3550 General Atomics Court) ;
  • Bujas, Roko (General Atomics, 3550 General Atomics Court) ;
  • Klein, Andre (General Atomics, 3550 General Atomics Court) ;
  • Horndt, Volker (General Atomics, 3550 General Atomics Court) ;
  • Wrosch, Matt (General Atomics, 3550 General Atomics Court)
  • 발행 : 2005.07.19
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초록

It is well known that proper encapsulation is crucial for the lifetime of organic light emitting diode (OLED) displays. With the development of increasingly better barrier coatings and perimeter seals, it has now become very desirable to be able to precisely measure the rate of water vapor and oxygen permeation through barrier coatings and perimeter sealing. This paper demonstrates a new permeation measurement method that uses tritium-containing water (HTO) as a tracer material. The theoretical detection limit of this direct method is $2.4{\times}10^{-8}g/(m^2day)$.

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