Properties of ZnO:Al thin film on variation of substrate temperature for display application

  • Keum, M.J. (Kyungwon University) ;
  • Kim, H.W. (Kyungwon University) ;
  • Cho, B.J. (Kyungwon University) ;
  • Son, I.H. (Shinsung college) ;
  • Choi, M.G. (Kyungwon college) ;
  • Lee, W.J. (Kyungwon college) ;
  • Jang, K.W. (Kyungwon college) ;
  • Kim, K.H. (Kyungwon University)
  • Published : 2005.07.19

Abstract

ZnO:Al(AZO) has been investigated for the photovoltaic cell or TCO(Transparent Conductive Oxide) of the display, because it has good electrical and optical properties. In this study, the ZnO:Al(AZO) thin film prepared on variation of substrate temperature by FTS(Facing Targets Sputtering) system. In case of TCO, because resistivity and roughness values affect the lighting of the OLED, their factors are very important. Therefore, in this paper, the electrical and optical properties of the AZO thin film were investigated with the deposition conditions and its roughness was investigated on variation of the substrate temperature. In results, AZO thin film deposited with the transmittance over 80% and the resistivity was reduced from $1.36{\times}10^{-3}$ [O-cm] to $4{\times}10^{-4}$ [O-cm] with increasing the substrate temperature from R.T to $200[^{\circ}C]$. Especially, we could obtain the resistivity $4{\times}10^{-4}$ [O-cm] of AZO thin film prepared at working pressure 1[mTorr], input current 0.4[A] and substrate temperature $200[^{\circ}C]$.

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