Dielectric Properties of Poly(vinyl phenol)/Titanium Oxide Nanocomposite Thin Films formed by Sol-gel Process

  • Myoung, Hey-J (Basic Semiconductor Research Lab., Electronics and Telecommunications Research Institute, Department of Polymer Science and Engineering, Inha University) ;
  • Kim, Chul-A (Basic Semiconductor Research Lab., Electronics and Telecommunications Research Institute) ;
  • You, In-Kyu (Basic Semiconductor Research Lab., Electronics and Telecommunications Research Institute) ;
  • Kang, Seung-Y (Basic Semiconductor Research Lab., Electronics and Telecommunications Research Institute) ;
  • Ahn, Seong-D (Basic Semiconductor Research Lab., Electronics and Telecommunications Research Institute) ;
  • Kim, Gi-H (Basic Semiconductor Research Lab., Electronics and Telecommunications Research Institute) ;
  • Oh, ji-young (Basic Semiconductor Research Lab., Electronics and Telecommunications Research Institute) ;
  • Baek, Kyu-Ha (Basic Semiconductor Research Lab., Electronics and Telecommunications Research Institute) ;
  • Suh, Kyung-S (Basic Semiconductor Research Lab., Electronics and Telecommunications Research Institute) ;
  • Chin, In-Joo (Department of Polymer Science and Engineering, Inha University)
  • Published : 2005.07.19

Abstract

Poly(vinyl phenol)(PVP)/$TiO_2$ nanocomposite the films have been prepared incorporating metal alkoxide with vinyl polymer to obtain high dielectric constant gate insulating material for a organic thin film transistor. The surface composition, the morphology, and the thermal and electrical properties of the hybrid nanocomposite films were observed by ESCA, scanning electron microscopy (SEM), atomic force microscopy(AFM), and thermogravimetric analysis (TGA). Thin hybrid films exhibit much higher dielectric constants (7.79 at 40wt% metal alkoxide).

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